Nakanishi, Yasuo and Yamada, Setsuo (2007): Market Value and Patent Quality in Japanese Manufacturing Firms.
Nakanishi, Yasuo and Yamada, Setsuo (2008): Patent Applications and the Grant Lag under Early Disclosure System: Empirical Estimates for Japanese Firms.
Nakanishi, Yasuo and Yamada, Setsuo (2008): Measuring the Rate of Obsolescence of Patents in Japanese Manufacturing Firms.
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